Ultra-Low Noise High-Resolution Controller for Charge Collection Microscopy Applications

SVZ Technologies has introduced a new generation of EBIC (Electron Beam-Induced Current) systems that significantly improves upon existing technology.

Unlike conventional EBIC systems that control the electron microscope beam to generate images—which slows down the process—SVZ Technologies’ system directly uses the microscope’s existing scanning capabilities. This innovative approach offers two key advantages:

  • Doubled image generation speed: You get your results much faster.
  • Minimized sample drift: This is a common problem during long imaging sessions, but SVZ’s method greatly reduces it, leading to more accurate images.

The system generates a two-dimensional EBIC image by scanning a sample that has a metal contact forming a Schottky barrier. Its software is quite flexible, allowing you to:

  • Plot a current profile along any axis you choose within the image, whether it’s horizontal, vertical, or at an incline.
  • Generate a fit within a specific area you select.

This means you can get more precise and stable EBIC images in less time, making your research or analysis more efficient.

More details: Ultra Low Noise High-Resolution EBIC Controller (SVZ Technologies)

Do you have any specific applications in mind where this improved EBIC system could be beneficial?

A two-dimensional electron beam-induced current (EBIC) image is generated during the scanning of a sample that features a metal contact forming a Schottky barrier.

Charge Collection Electron Microscopy Devices: a) Ultra Low Noice High-Resolution EBIC Controller b) Low Noise Low Drift Amplifier/Scanbox c) SVZ EBIC-2 System Controller